| 摘要 |
An autofocus module (30) for a microscope-based system (1) is equipped in such a way that a light source (31) which generates a measurement light bundle (32) is provided. A first axicon (34a) generates an eccentrically extending annularly divergent measurement light beam bundle (32a). A second axicon (34a) is provided in order to parallelize the remitted divergent measurement light beam bundle (32b). A differential diode (42) is mounted in the module (30) for determination of the focus position.
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