发明名称 METHOD AND APPARATUS FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To heat a substrate to be treated to the treatment temperature in a short time, to uniformly supply the treatment fluid to the substrate to be treated, to improve throughput and to uniform the treatment. SOLUTION: In the state of housing a wafer W held by a holding means 35 in a processing chamber 34a of a treating container 34 provided with a heater 31A (heating means), and the state of positioning on a closely (preheating) position Pa by relatively moving the wafer W and a heating surface of the heating means (the horizontal bottom surface of a container body 32) closer to each other, the wafer W is heated (raised the temperature) to the treatment temperature. After heating (raising the temperature) the wafer W to the treatment temperature, the wafer and the horizontal bottom surface of the container 32 are separated to the treatment position Pb. In this state, the treatment fluid is supplied in the processing chamber 34a of the treating container 34, and the holding means 35 and the heating means (horizontal bottom surface of the container body 32) is approached, separated and moved intermittently or continuously and relatively. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004200666(A) 申请公布日期 2004.07.15
申请号 JP20030398744 申请日期 2003.11.28
申请人 TOKYO ELECTRON LTD 发明人 MOKUO KATSUTOSHI
分类号 H01L21/683;H01L21/027;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 主分类号 H01L21/683
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