METHOD OF ANALYSING A STACK OF FLAT OBJECTS

摘要

The present invention relates to a method of analysing a stack of flat objects, which method comprises the steps of providing a stack of flat objects, which stack comprises at least one surface defined by the edges of flat objects, illuminating the surface of said stack, providing a two-dimensional image of the stack by making use of an optical sensor, and providing an output signal that represents the result of the analysis, wherein the provision of the two-dimensional image is carried out in such a manner that the image is enlarged in the y-direction and reduced in the x-direction, which y-direction is defined as the height of stack of flat objects and which x-direction is defined as the width of the stack of flat objects.