发明名称 Semiconductor device and method of fabricating the same, nonvolatile semiconductor memory and method of fabricating the same, and electronic apparatus including nonvolatile semiconductor memory
摘要 A semiconductor device according to an aspect of the present invention having a first gate insulating film formed in a first active region of a semiconductor substrate and having a first film thickness, and a second gate insulating film formed in a second active region of the semiconductor substrate and having a second film thickness smaller than the first film thickness, wherein a semiconductor substrate surface in the first active region is lower than that in the second active region is provided.
申请公布号 US2004135198(A1) 申请公布日期 2004.07.15
申请号 US20030623520 申请日期 2003.07.22
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MURAHAMA YUUICHIRO
分类号 H01L21/316;H01L21/762;H01L21/8234;H01L21/8238;H01L21/8247;(IPC1-7):H01L29/76 主分类号 H01L21/316
代理机构 代理人
主权项
地址