发明名称 |
Method for forming metal line of semiconductor device |
摘要 |
Methods for forming metal line of semiconductor device wherein via contact plug is formed without the deposition process of Ti/TiN liner layer and conductive layer filling a via contact hole so that the formation processes of a conductive layer for lower metal line and a conductive layer for via contact plug can be performed successively without interruption is disclosed. The method comprises the steps of: (a) sequentially forming a conductive layer for lower metal line and a conductive layer for via contact plug on a planarized first interlayer insulating film having a contact plug; (b) etching the conductive layer for via contact plug and the conductive layer for lower metal line using lower metal line mask to form a lower metal line; (c) forming a second interlayer insulating film on the entire surface; (d) etching the second interlayer insulating film and the conductive layer for via contact plug using a via contact mask to form a via contact plug; (e) forming a third interlayer insulating film on the entire surface; (f) performing a planarization process to expose a upper surface of the via contact plug; and (g) forming an upper metal line electrically connected to the via contact plug.
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申请公布号 |
US2004137719(A1) |
申请公布日期 |
2004.07.15 |
申请号 |
US20030608082 |
申请日期 |
2003.06.30 |
申请人 |
JIN WON HWA |
发明人 |
JIN WON HWA |
分类号 |
H01L21/60;H01L21/768;H01L23/522;(IPC1-7):H01L21/44;H01L21/476 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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