| 摘要 |
PROBLEM TO BE SOLVED: To provide a method which enables a defect inspection in a perpendicular magnetic recording medium with a high degree of sensitivity and in a short period of time, and provide a program for executing the above. SOLUTION: A perpendicular magnetic recording medium in which at least a soft magnetic backing layer 2, an intermediate layer 3, a perpendicular magnetic recording layer 4, and a protective layer 5 are stacked one by one on a non-magnetic substrate 1, is subjected to batch dc demagnetization by a permanent magnet or an electromagnet beforehand, an output waveform of a reproduced signal of this perpendicular magnetic recording medium is compared with the waveform of a reference signal, and a drop out section is determined as a defect. Thereby, accuracy for specifying position and size of a defect section can be enhanced regardless of recording capability of the recording medium, and it becomes possible to largely shorten the defect inspection time. Further, it becomes unnecessary to introduce a new defect inspection provision or to convert the provision each time when recording density of the magnetic recording medium is changed, and production cost is reduced and an inexpensive magnetic recording medium can be offered. COPYRIGHT: (C)2004,JPO&NCIPI
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