发明名称 Semiconductor device
摘要 A semiconductor device includes a trench formed on the source side of the drift region, the p-type gate region and the gate formed at the bottom of the trench, and the source formed over the entire surface of the unit device through the insulating film. The narrowest portion of the channel is deeper than one-half the junction depth of the p-type gate region. This allows the width of the channel on the drain side to be reduced even with a lower energy.
申请公布号 US2004135178(A1) 申请公布日期 2004.07.15
申请号 US20030681126 申请日期 2003.10.09
申请人 ONOSE HIDEKATSU;HOMMA HIDEO;WATANABE ATSUO 发明人 ONOSE HIDEKATSU;HOMMA HIDEO;WATANABE ATSUO
分类号 H01L29/80;H01L21/337;H01L29/10;H01L29/772;H01L29/808;(IPC1-7):H01L29/80;H01L31/112 主分类号 H01L29/80
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