发明名称 |
Semiconductor memory with vertical charge trapping cells, e.g. read only memory (ROM) cells with transistors on trough walls for extended miniaturizing, with spaced troughs on surface of semiconductor substrate, with insulating troughs |
摘要 |
On surface of semiconductor substrate are located numerous, parallel spaced troughs (7,8). On the surface is located memory cell field (10) with memory transistors wall-fitted channel region separated from gate electrode by gate dielectric. The troughs consist of alternative insulation (7) and active troughs (8), with insulation troughs also located between lower bit lines. Bit line contacts (16,17) are fitted on top bit lines (15) and other bit line contacts (17) are fitted on lower bit lines, coupled conductively to metallising plane for wiring. The contacts are fitted on opposite sides of memory cell field. Independent claims are included for method of manufacturing semiconductor ROM with vertical charge trapping memory cells.
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申请公布号 |
DE10260185(A1) |
申请公布日期 |
2004.07.15 |
申请号 |
DE20021060185 |
申请日期 |
2002.12.20 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SACHSE, JENS-UWE;LUDWIG, CHRISTOPH;DEPPE, JOACHIM;KLEINT, CHRISTOPH |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L21/8234;H01L21/8246;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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