| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To solve a problem wherein, in a switch circuit composed by serially connecting FETs in multiple stages, only a part of the electrodes of the FETs is led to the outside, so that D.C. inspection of the respective FETs can not be carried out, and selection by high-frequency measurement is needed before shipment. <P>SOLUTION: Inspecting terminals are formed so as to lead the electrodes of all the FETs to the outside, and the D.C. inspection of the respective FETs is carried out by using the outside terminals and the inspecting terminals. Thereby, the need of the selection by high-frequency measurement before shipment is obviated, and it is not necessary to prepare an expensive high-frequency measuring instrument in a production line to reduce measuring man-hours. In addition, the D.C. inspection can be carried out with the outside shape kept small by packaging them in a chip size package, to restrain an investment amount for forming the inspecting terminals. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
