发明名称 Manufacturing process for a high voltage transistor integrated on a semiconductor substrate with non-volatile memory cells and corresponding transistor
摘要 A process for fabricating high-voltage drain-extension transistors, whereby the transistors are integrated in a semiconductor substrate along with non-volatile memory cells that include floating gate transistors. The process includes: defining respective active areas for HV transistors and floating gate transistors in a semiconductor substrate, with the active areas separated from each other by insulating regions; forming insulated gate regions of the HV transistors; performing a first dopant implantation to form first portions of the HV transistor junctions; conformably depositing a dielectric layer onto the whole substrate to provide an interpoly layer of the floating gate transistor; making openings at the first portions of the HV transistor junctions; performing, through the openings, a second dopant implantation to form second portions of the high-voltage transistor junctions, with perimeter areas of the gate regions and the active area of the floating gate transistor being screened off by the dielectric layer.
申请公布号 US2004137668(A1) 申请公布日期 2004.07.15
申请号 US20030675245 申请日期 2003.09.29
申请人 STMICROELECTRONICS S.R.L. 发明人 ZULIANI PAOLA;GIARDA KATIA;ANNUNZIATA ROBERTO
分类号 H01L21/336;H01L21/8247;H01L27/105;(IPC1-7):H01L21/335 主分类号 H01L21/336
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