| 发明名称 |
Digital measuring system and method for integrated circuit chip operating parameters |
| 摘要 |
This invention relates to digitally measuring operating parameters, for example, temperature, within a semiconductor chip and making those measurements internally available to hardware, firmware, and software.
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| 申请公布号 |
US2004136436(A1) |
申请公布日期 |
2004.07.15 |
| 申请号 |
US20030339992 |
申请日期 |
2003.01.10 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
AINSPAN HERSCHEL;EMMA PHILIP G.;RAND RICK A.;ZINGHER ARTHUR R. |
| 分类号 |
G01K1/02;G01K7/42;(IPC1-7):G01K13/00 |
主分类号 |
G01K1/02 |
| 代理机构 |
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| 地址 |
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