发明名称 ASSESSMENT AND OPTIMIZATION FOR METROLOGY INSTRUMENT
摘要 <p>Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation.</p>
申请公布号 WO2004059247(A1) 申请公布日期 2004.07.15
申请号 WO2002US41180 申请日期 2002.12.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;ARCHIE, CHARLES, N.;BANKE, JR. WILLIAM, G. 发明人 ARCHIE, CHARLES, N.;BANKE, JR. WILLIAM, G.
分类号 G01B11/03;G01B11/14;G01D18/00;G03F7/20;(IPC1-7):G01B11/14 主分类号 G01B11/03
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