发明名称 |
METHOD FOR LITHOGRAPHICALLY STRUCTURING A SUBSTRATE, AND LACQUER SYSTEM |
摘要 |
The invention relates to a method for lithographically structuring a substrate (10) by means of an electron beam, particularly for producing photomasks. Said method is characterized by the fact that first at least one electrically conductive, water-insoluble lower lacquer layer (1) is applied to the substrate (10), followed by at least one upper lacquer layer (2) made of electron beam-sensitive photoresist so as to create a lacquer system (1, 2). Such a lacquer system allows negative charges to discharge, whereby the electron beam is prevented from being deflected due to charging effects. |
申请公布号 |
WO2004025369(A3) |
申请公布日期 |
2004.07.15 |
申请号 |
WO2003DE02880 |
申请日期 |
2003.08.27 |
申请人 |
INFINEON TECHNOLOGIES AG;ELIAN, KLAUS;SCHUMANN, JOERG |
发明人 |
ELIAN, KLAUS;SCHUMANN, JOERG |
分类号 |
G03F1/00;G03F7/09 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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