发明名称 METHOD FOR LITHOGRAPHICALLY STRUCTURING A SUBSTRATE, AND LACQUER SYSTEM
摘要 The invention relates to a method for lithographically structuring a substrate (10) by means of an electron beam, particularly for producing photomasks. Said method is characterized by the fact that first at least one electrically conductive, water-insoluble lower lacquer layer (1) is applied to the substrate (10), followed by at least one upper lacquer layer (2) made of electron beam-sensitive photoresist so as to create a lacquer system (1, 2). Such a lacquer system allows negative charges to discharge, whereby the electron beam is prevented from being deflected due to charging effects.
申请公布号 WO2004025369(A3) 申请公布日期 2004.07.15
申请号 WO2003DE02880 申请日期 2003.08.27
申请人 INFINEON TECHNOLOGIES AG;ELIAN, KLAUS;SCHUMANN, JOERG 发明人 ELIAN, KLAUS;SCHUMANN, JOERG
分类号 G03F1/00;G03F7/09 主分类号 G03F1/00
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