| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a time-resolved reflection measuring apparatus for easily obtaining accurate phase information. <P>SOLUTION: In a time-resolved reflection measuring method, a terahertz pulse light L4 is radiated to a parallel plate sample 9, a time-series waveform of a reflected terahertz pulse light L5 from the sample 9 is detected, and a characteristic of the sample 9 is measured. A reference signal is the reflected pulse light on a sample entrance face included in the reflected terahertz pulse light L5. A sample signal is a difference signal as the reflected terahertz pulse light L5 other than the reflected pulse light. The characteristic of the sample 9 is measured based on the reference signal and the sample signal. The phase information can be easily and accurately measured without measurement using a reference mirror etc. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
