发明名称 LITHOGRAPHY SYSTEM AND DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface cleaning method which can remove contaminants quickly and effectively for a lithography projection system. SOLUTION: A radical beam 7 is generated with a downstream radical beam source 10 to remove contaminants from a surface 8. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004200686(A) 申请公布日期 2004.07.15
申请号 JP20030414495 申请日期 2003.12.12
申请人 ASML NETHERLANDS BV 发明人 VAN BEEK MICHAEL CORNELIS;BAKKER LEVINUS PIETER;BISSCHOPS THEODORUS HUBERTUS JOSEPHUS;JONKERS JEROEN;KROON MARK;WOLTERS ROBERTUS ADRIANUS MARIA;MAAS ADRIANUS JOHANNES HENRICUS
分类号 H01L21/027;B08B7/00;G03F7/20;(IPC1-7):H01L21/027 主分类号 H01L21/027
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