| 摘要 |
PROBLEM TO BE SOLVED: To provide a photoreceptor property evaluation device capable of accurately evaluating film properties related to an electrophotographic process. SOLUTION: The photoreceptor property evaluation device comprises a surface potential measuring probe 104 for measuring surface potential of a cylindrical photoreceptor 101, a film thickness measuring probe 112 for measuring film thickness of the photoreceptor 101 disposed in such a way as to measure film thickness in the same position as the measuring position of the surface potential measuring probe 104, and a control means to calculate film properties of the photoreceptor 101 from the results of measurements as well as to control measurements by the surface potential measuring probe 104 and the film thickness measuring probe 112. COPYRIGHT: (C)2004,JPO&NCIPI
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