发明名称 PICKUP TEST EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a pickup test equipment which can enhance the inspection efficiency of a pickup. SOLUTION: This equipment is the pickup test equipment 1 which inspects performances of pickups which are mounted on a disk drive, and which can read disk data. The equipment comprises a disk drive unit to support and rotate a disk, and pickup transport units 20 on which the pickups are mounted so as to read the disk supported by the disk drive unit, and which are constituted so as to transport them to the disk drive unit. A plurality of the pickup transport units 20 are provided on the one disk drive unit so that the performances of a plurality of the pickups can be inspected simultaneously. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004199852(A) 申请公布日期 2004.07.15
申请号 JP20030347543 申请日期 2003.10.06
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 PARK CHUL-SOO;TEI ZAIKEN;DEN HEIKAN;KEE JONG-IL
分类号 G11B7/22;(IPC1-7):G11B7/22 主分类号 G11B7/22
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