| 发明名称 |
A MEMORY TEST SYSTEM WITH A MEANS FOR TEST SEQUENCE OPTIMISATION AND A METHOD OF ITS OPERATION |
| 摘要 |
<p>Automatic test equipment for memory devices with means to optimise features of the test according to the test results generated by the equipment at an individual defect level.</p> |
| 申请公布号 |
EP1040358(B1) |
申请公布日期 |
2004.07.14 |
| 申请号 |
EP19980950530 |
申请日期 |
1998.08.10 |
| 申请人 |
ACUID CORPORATION LIMITED |
发明人 |
MUSTAFINA, EKATERINA NIKOLAEVNA;DEAS, ALEXANDER, ROGER |
| 分类号 |
G01R31/28;G01R31/3183;G01R31/3193;G11C29/56;(IPC1-7):G01R1/00 |
主分类号 |
G01R31/28 |
| 代理机构 |
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代理人 |
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| 地址 |
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