Semiconductor device allowing easy confirmation of operation of built in clock generation circuit

摘要

A shift register which outputs a delay control signal for a delay line is made controllable at a test mode by a TEST MODE address buffer receiving an external address as a control signal and a phase comparator. Thus whether the delay of the delay line is correctly controlled or not can be confirmed through observation of an internal clock signal int. CLK output from an output buffer at the test and an external clock signal ext. CLK.