发明名称 Semiconductor integrated circuit device and a method of manufacturing the same
摘要 In order to improve the performance of a semiconductor integrated circuit device wherein a capacitor provided between storage nodes of an SRAM and a device having an analog capacitor are formed on a single substrate, a plug is formed in a silicon oxide film on a pair of n channel type MISFETs in a memory cell forming area, and a local wiring LIc for connecting respective gate electrodes and drains of the pair of n channel type MISFETs is formed over the silicon oxide film and the plug. Thereafter, a capacitive insulating film and an upper electrode are further formed over the local wiring LIc. According to the same process step as the local wiring, capacitive insulating film and upper electrode formed in the memory cell forming area, a local wiring LIc, a capacitive insulating film and an upper electrode are formed over a silicon oxide film in an analog capacitor forming area and a plug in the silicon oxide film.
申请公布号 US6762444(B2) 申请公布日期 2004.07.13
申请号 US20020308001 申请日期 2002.12.03
申请人 RENESAS TECHNOLOGY CORPORATION 发明人 OOTSUKA FUMIO;NONAKA YUSUKE;SHIMAMOTO SATOSHI;OMORI SOHEI;KAZAMA HIDETO
分类号 H01L21/768;H01L21/822;H01L21/8244;H01L27/04;H01L27/10;H01L27/11;(IPC1-7):H01L21/336;H01L21/823;H01L21/00;H01L21/824;H01L21/84 主分类号 H01L21/768
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