发明名称 Nonvolatile memory device with sense amplifier securing reading margin
摘要 In a sense amplifier, local I/O lines are maintained at a predetermined voltage by transistors. Transistors forming a current mirror supply an operating current according to a passing current which flows through transistors, to sense nodes. Transistors forming a current mirror extract an operating current according to the passing current which flows through transistors, from sense nodes. As a result, a voltage difference is generated in sense nodes in accordance with the operating current difference.
申请公布号 US6762953(B2) 申请公布日期 2004.07.13
申请号 US20030455479 申请日期 2003.06.06
申请人 RENESAS TECHNOLOGY CORP.;MITSUBISHI ELECTRIC ENGINEERING COMPANY LIMITED 发明人 TANIZAKI HIROAKI;HIDAKA HIDETO;OOISHI TSUKASA
分类号 G11C11/15;G11C7/06;G11C7/14;G11C11/16;G11C16/28;(IPC1-7):G11C11/00;G11C7/00 主分类号 G11C11/15
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