发明名称 MOSFET with SiGe source/drain regions and epitaxial gate dielectric
摘要 In accordance with the invention, a MOSFET includes a well, a channel formed in the well, a high K layer overlying the channel, a buffer layer overlying the high k layer, a gate overlaying the buffer layer, a blocking layer overlying the gate and two source/drain regions. In some embodiments the gate and the source/drain regions are silicon germanium.
申请公布号 US6762463(B2) 申请公布日期 2004.07.13
申请号 US20010877906 申请日期 2001.06.09
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KIM HYEON-SEAG
分类号 H01L21/28;H01L21/336;H01L29/165;H01L29/51;(IPC1-7):H01L29/94;H01L31/119 主分类号 H01L21/28
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