| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To enable reflection spectrum measurement and transmission spectrum measurement, using a terahertz light with a single spectral device. <P>SOLUTION: A reflection measurement optical system for irradiating a sample S (a location A) with terahertz pulse light and detecting a reflection light reflected from the sample and a transmission measurement optical system for irradiating the sample S (a location B) with the terahertz pulse light and detecting a transmission light transmitted through the sample can be switched. A detected light, as the reflection light or the transmission light, is measured by a time-series conversion terahertz spectrum. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
