摘要 |
A method for monitoring wall thickness of an object having an electrically conductive wall, using a pulsed eddy current probe comprising a transmitter means and a receiver means, which method comprises selecting an inspection location on the wall; at a plurality of inspection times thetam (m=1,...,M; M>=2), arranging the probe in a predetermined position relative to the inspection location, inducing transient eddy currents in the object by activating the transmitter means, recording signals Vm with the receiver means; and determining, from each of the signals Vm, a wall thickness dm pertaining to inspection time thetam, wherein the temperature of the object at the inspection location at the inspection time thetam is taken into account. |