发明名称 Halbleiterwafer zum Durchführen eines Burn-In-Tests
摘要 A semiconductor wafer, having a relatively wide power supply line and ground line, and which can also prevent short-circuiting between these lines. Multiple integrated circuit formation regions, whereon integrated circuits have been formed, are disposed on a semiconductor wafer. A silicon oxide film is formed on a silicon substrate, and a ground line conductor is formed on the silicon oxide film. This ground line conductor is extended over scribe lines. A layer insulation film composed of silicon oxide film is deposited on the silicon oxide film with the ground line conductor interposed therebetween, and a power supply line conductor is formed on the layer insulation film to overlap the ground line conductor. The power supply line conductor is extended over scribe lines. In the integrated circuit formation regions, a power supply pad and the power supply line conductor are electrically connected. A ground pad and the ground line conductor are also electrically connected.
申请公布号 DE4444584(B4) 申请公布日期 2004.07.08
申请号 DE19944444584 申请日期 1994.12.14
申请人 DENSO CORP., KARIYA 发明人 SAITOU, MITSUHIRO;NUMAZAKI, KOUJI;BAN, HIROYUKI
分类号 H01L21/66;H01L21/822;H01L23/528;H01L23/58;H01L27/02;H01L27/04;(IPC1-7):H01L23/528 主分类号 H01L21/66
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