发明名称 LITHOGRAPHY APPARATUS FOR SEMICONDUCTOR PROCESSING
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a lithography apparatus for semiconductor processing for generating a mask-less pattern using a MDI process technique. <P>SOLUTION: The lithography apparatus for semiconductor processing for generating a mask-less pattern includes, a source integrated light valve (SLV) array 420 of radiation source cells (RSCs) which are formed on a flexible insulating film supported by a supporting frame 426 and arranged in a matrix; and control logic mechanisms 424 which are arranged on the film for controlling the cells, each cell including a radiation source, a target on which radiation is incident to generate x-rays, and an aperture (REA) for radiating x-rays on a surface to be exposed by the target. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004193618(A) 申请公布日期 2004.07.08
申请号 JP20030411658 申请日期 2003.12.10
申请人 LEEDY GLENN J 发明人 LEEDY GLENN J
分类号 G21K5/02;B81B3/00;G02F1/13;G03F7/20;G11C29/00;H01L21/027;H01L21/306;H01L21/331;H01L21/336;H01L21/76;H01L21/762;H01L21/764;H01L21/822;H01L21/8234;H01L21/8238;H01L21/98;H01L23/48;H01L23/538;H01L25/065;H01L27/00;H01L27/02;H01L27/08;H01L27/088;H01L27/092;H01L27/12;H01L29/732;H01L29/78;H01L29/786;H05G1/00;(IPC1-7):H01L21/027;H01L21/823 主分类号 G21K5/02
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