发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has a contact via in which a contact resistance does not increase even by making it microscopic, and its manufacturing method. SOLUTION: The semiconductor device has a first conductive layer and a wiring connection part in which a metal material constituting the first conductive layer is diffused in an insulator to indicate the conductivity, and the semiconductor device is constituted so that the first conductive layer is electrically connected to the insulator. The manufacturing method comprises the step in which the diffusion is caused by a function of heat or an electric field. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004193422(A) 申请公布日期 2004.07.08
申请号 JP20020361074 申请日期 2002.12.12
申请人 FUJITSU LTD 发明人 SUGIURA IWAO;NAMIKI TAKAHISA;NAKADA YOSHIHIRO;SUZUKI KATSUMI
分类号 H01L23/522;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L23/522
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