发明名称 CHIP FOR INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a chip for inspection which can supply a sample liquid to a plurality of reagent layers almost at the same time and can perform the coloring reaction equably when many items of components are mainly measured optically. SOLUTION: One end thereof is connected to a dropping part of a sample, and a passage is formed, which can supply the sample to the center of a reagent part from the other end. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004191336(A) 申请公布日期 2004.07.08
申请号 JP20020362981 申请日期 2002.12.13
申请人 ADVANCE CO LTD 发明人 IWATA TAKESHI
分类号 G01N33/48;A61B5/15;A61B5/151;G01N21/03;G01N21/78;G01N33/483;(IPC1-7):G01N21/03 主分类号 G01N33/48
代理机构 代理人
主权项
地址