发明名称 CVD METHOD OF POROUS DIELECTRIC MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a porous silica material having better properties suitable for being used for microelectronic manufacturing, and a process for material manufacturing which is easily integrated to a manufacturing process flow. SOLUTION: A porous dielectric film useful in a semiconductor industry is prepared by depositing an Si-O-C film using a precursor containing carbon and oxygen, and thereafter by decomposing an organic fragment captured inside by heating the Si-O-C film. A method for preparing the porous silica film comprises a step in which the Si-O-C film having a specific dielectric constant k<SB>1</SB>is deposited by chemical vapor deposition using a carbon oxygen compound and a silicon source, a step in which the carbon oxygen compound is not combined with silicon atoms, and a step in which the Si-O-C film is heated so as to form a porous silica film having a specific dielectric constant k<SB>2</SB>(here, k<SB>1</SB>≥k<SB>2</SB>). COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004193622(A) 申请公布日期 2004.07.08
申请号 JP20030412850 申请日期 2003.12.11
申请人 ASM JAPAN KK 发明人 TODD MICHAEL A
分类号 C23C16/42;C23C16/30;C23C16/56;H01L21/316;H01L21/768;(IPC1-7):H01L21/316 主分类号 C23C16/42
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