发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and its manufacturing method capable of suppressing outward diffusion of the impurity from a device isolation film containing the impurity in a heat treatment when forming another member after forming the device isolation film in the device isolation film containing the impurity. SOLUTION: In a device isolation structure formed by filling a trench 12 formed in the surface of a substrate 1 with the device isolation film 2, the device isolation film 2 contains impurity, and concentration of the impurity is more reduced at an upper portion of the device isolation film 2 than at the bottom of the same. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004193205(A) 申请公布日期 2004.07.08
申请号 JP20020356682 申请日期 2002.12.09
申请人 RENESAS TECHNOLOGY CORP 发明人 KITAZAWA MASASHI;KUROI TAKASHI
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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