发明名称 Underlayer for polysilicon TFT
摘要 Polycrystalline silicon in semiconductor device is usually crystallized at high temperature annealing. Generally a low heat conducting underlayer is needed to protect substrate and silicon from high temperature crystallization. This invention proposes a new underlayer that improves silicon crystallization and protects substrate during the annealing process. The semiconductor device is a thin film transistor suitable for use in such applications as liquid crystal displays, light emitting diodes, imaging sensors and photovoltaic cells.
申请公布号 US2004130005(A1) 申请公布日期 2004.07.08
申请号 US20030668873 申请日期 2003.09.23
申请人 GUZMAN GUILLAUME;MECHKEN SONIA 发明人 GUZMAN GUILLAUME;MECHKEN SONIA
分类号 H01L21/20;(IPC1-7):H01L23/58 主分类号 H01L21/20
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