| 摘要 |
A method for monitoring wall thickness of an object having an electrically conductive wall, using a pulsed eddy current probe comprising a transmitter means and a receiver means, which method comprises selecting an inspection location on the wall; at a plurality of inspection times thetam (m=2, . . . ,M), arranging the probe in a predetermined position relative to the inspection location, inducing transient eddy currents in the object by activating the transmitter means, recording signals Vm with the receiver means; determining, for each inspection time thetam, a temperature Tm indicative of the temperature of the object at the inspection location; and determining, from each of the signals Vm, a wall thickness dm pertaining to inspection time thetam, wherein the temperature Tm is taken into account.
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