发明名称 Nonvolatile semiconductor memory device and manufacturing method thereof
摘要 The object of the present invention is to provide a new nonvolatile semiconductor memory device and its manufacturing method for the purpose of miniaturizing a virtual grounding type memory cell based on a three-layer polysilicon gate, enhancing the performance, and boosting the yield. In a memory cell according to the present invention, a floating gate's two end faces perpendicular to a word line and channel are partly placed over the top of a third gate via a dielectric film. The present invention can reduce the memory cell area of a nonvolatile semiconductor memory device, increase the operating speed, and enhances the yield.
申请公布号 US2004129986(A1) 申请公布日期 2004.07.08
申请号 US20030718563 申请日期 2003.11.24
申请人 RENESAS TECHNOLOGY CORP. 发明人 KOBAYASHI TAKASHI;SASAGO YOSHITAKA;ARIGANE TSUYOSHI;IKEDA YOSHIHIRO;KANAMITSU KENJI
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L21/82;H01L29/94 主分类号 G11C16/04
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