发明名称 FIELD-EFFECT TRANSISTOR (FET) HAVING STRESS CHANNEL AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a field-effect transistor whose charge carrier mobility increases by the stress of an electric current channel 22. SOLUTION: The direction of the stress is that in which a current flows (vertical direction). For a PFET device, the stress is compressive stress, while the stress is tensile stress in an NFET device. The stress is produced by a compressive film 34 located in an area 32 under the channel. The compressive film pushes up the channel 22 which bends the channel. In the PFET device, the compressive film is arranged under the edge 31 of the channel (e.g., under a source or drain) which compresses the upper part 22A of the channel. In the NFET device, the compressive film is arranged under the center 40 of the channel (e.g., under the gate) which pulls the upper part 22A of the channel. Therefore, both the NFET device and the PFET device can be strengthened. A method for manufacturing these devices is included. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004193596(A) 申请公布日期 2004.07.08
申请号 JP20030396240 申请日期 2003.11.26
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 DORIS BRUCE B;CHIDAMBARRAO DURESETI;BAIE XAVIER;MANDELMAN JACK A;SADANA DEVENDRA K;SCHEPIS DOMINIC J
分类号 H01L27/08;H01L21/336;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L27/08
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