TFT ARRAY PANEL STRUCTURE CAPABLE OF CONDUCTING LOG LINE DISCONNECTION TEST

摘要

PURPOSE: A TFT array panel structure capable of conducting an LOG(Line On Glass) disconnection test is provided to detect a short of a GGS(Gate Gate Short) and an LOG signal line while performing a test by a 1G2D method, thereby enabling an LOG disconnection test. CONSTITUTION: In a 1G2D test circuit, a common line(300) is wired between gate lines of a fanout portion(200) to detect a GCS(Gate Common Short) when a short is generated. A 1G line(210) cannot detect a short in a part crossed with a signal line for testing the gate lines only. A portion of an LOG line(220) to which a signal is applied is contacted. An end of the LOG line(220) is shorted to detect a short with an adjacent line. The common line(300) uses metals different from gate metal lines used for a fanout.