发明名称 INSPECTION DEVICE OF LIQUID CRYSTAL DISPLAY DEVICE
摘要 PURPOSE: An inspection device of an LCD device is provided to configure a TG(Transmission Gate) signal applying pad for applying a TG driving signal on the same TFT substrate as an OS(Open Short) pad, and to connect a channel terminal with data lines when the data lines are inspected as being inferior, thereby transmitting a test signal up to the OS pad. CONSTITUTION: A TFT substrate(200) forms a pixel array. A PCB supplies an image signal to the TFT substrate(200). Plural driving ICs(210) receive the image signal from the PCB. A flexible cable film electrically connects the PCB with the driving ICs(210). The TFT substrate(200) is configured by a COG(Chip On Glass) method for directly configuring the driving ICs(210) on the TFT substrate(200). Plural gate lines are arrayed on the TFT substrate(200) in width direction. Plural data lines(DL) are arrayed along a longitudinal direction of the TFT substrate(200) to cross the gate lines.
申请公布号 KR20040061673(A) 申请公布日期 2004.07.07
申请号 KR20020087958 申请日期 2002.12.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, JANG WON;KIM, CHEOL HO;PARK, GYEONG MIN
分类号 G02F1/13;(IPC1-7):G02F1/13 主分类号 G02F1/13
代理机构 代理人
主权项
地址