发明名称 SPIN SCRUBBER OF SEMICONDUCTOR WAFER
摘要 PURPOSE: A spin scrubber of a semiconductor wafer is provided to improve a removal rate of a defect and prevent a loss of productivity from increasing by simultaneously performing a brush cleaning process and an ultrasonic cleaning process. CONSTITUTION: A spin cup(12) made of a cylindrical type having an opening in its upper part is formed on a support plate, capable of supporting the wafer in an increased position. A deionized water injecting nozzle(13) injects deionized water toward a wafer from a side of the spin cup, mounted on the spin cup. The wafer is placed on the upper plate of a spin chuck(17) that is rotated to uniformly distribute the deionized water to the wafer. A brush arm is located in the outside of a side of the spin cup. The brush arm has a brush(24) at its end and the end part of the brush arm can rotatively transfers to the wafer at a predetermined angle with respect to a fixed axis in a brush cleaning process. An ultrasonic wave generator(26) generates ultrasonic waves at the end part of the brush arm.
申请公布号 KR20040061096(A) 申请公布日期 2004.07.07
申请号 KR20020086877 申请日期 2002.12.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DAE JONG
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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