发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor memory device is provided to be capable of stabilizing threshold voltage of a cell transistor. CONSTITUTION: An active region is defined by forming an isolation layer(20) on a semiconductor substrate(10). The first channel control ions(30) are implanted into the resultant structure. The second channel control ions(50) are implanted into both edges of a drain forming region in the active region. A word line is formed on the active region. A source and drain region are then formed in the substrate.
申请公布号 KR20040059994(A) 申请公布日期 2004.07.06
申请号 KR20020086503 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SEONG JO
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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