发明名称 |
METHOD FOR MANUFACTURING COPPER DIFFUSION BARRIER |
摘要 |
<p>PURPOSE: A method for manufacturing a copper diffusion barrier is provided to effectively prevent copper from diffusing into an unwanted portion by using an Ru/RuxOy/Ru layer as the copper diffusion barrier. CONSTITUTION: An insulating layer(12) is selectively formed on a substrate(10). A first Ru layer(14) is formed on the entire surface of the resultant structure. An oxide layer(16) is formed on the resultant structure. A second Ru layer(18) is formed on the entire surface of the oxide layer. A copper layer(20) is then formed on the entire surface of the resultant structure. A silicon substrate is used as the substrate. The first Ru layer and the second Ru layer are formed as much as 1000 angstrom, or less, by carrying out a sputtering process or a CVD(Chemical Vapor Deposition). The oxide layer is formed by carrying out a plasma treatment using N2O or O2.</p> |
申请公布号 |
KR20040059853(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086358 |
申请日期 |
2002.12.30 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE SEOK |
分类号 |
H01L21/28;H01L23/532;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|