发明名称 METHOD FOR MANUFACTURING COPPER DIFFUSION BARRIER
摘要 <p>PURPOSE: A method for manufacturing a copper diffusion barrier is provided to effectively prevent copper from diffusing into an unwanted portion by using an Ru/RuxOy/Ru layer as the copper diffusion barrier. CONSTITUTION: An insulating layer(12) is selectively formed on a substrate(10). A first Ru layer(14) is formed on the entire surface of the resultant structure. An oxide layer(16) is formed on the resultant structure. A second Ru layer(18) is formed on the entire surface of the oxide layer. A copper layer(20) is then formed on the entire surface of the resultant structure. A silicon substrate is used as the substrate. The first Ru layer and the second Ru layer are formed as much as 1000 angstrom, or less, by carrying out a sputtering process or a CVD(Chemical Vapor Deposition). The oxide layer is formed by carrying out a plasma treatment using N2O or O2.</p>
申请公布号 KR20040059853(A) 申请公布日期 2004.07.06
申请号 KR20020086358 申请日期 2002.12.30
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 LEE, JAE SEOK
分类号 H01L21/28;H01L23/532;(IPC1-7):H01L21/28 主分类号 H01L21/28
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