发明名称 |
SEMICONDUCTOR DEVICE WITH PASSIVATION LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to improve reliability and yield by preventing bubble in a passivation layer. CONSTITUTION: Top metal interconnections(130) are formed on a semiconductor substrate(100). A passivation layer is formed on the top metal interconnections. An oxide spacer(140) is formed at both sidewalls of the top metal interconnections to prevent bubble. The passivation layer is provided with an oxide layer(145) and a silicon nitride layer(150). A TEOS layer is used as the oxide spacer and the oxide layer.
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申请公布号 |
KR20040059999(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086508 |
申请日期 |
2002.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, HUI SIK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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