发明名称 Memory device with divided bit-line architecture
摘要 The present invention relates to an improved memory circuit with a divided bit-line, shared sense amplifier architecture. In a conventional divided bit-line, shared sense amplifier configuration, two adjacent memory sub-arrays are generally located between two banks of sense amplifiers and selected bit lines of the two adjacent memory sub-arrays are generally connected to metal lines with metal contacts to reduce capacitive loading. Under the present invention, some sense amplifiers from either banks of sense amplifiers are repositioned to the area between the two adjacent memory sub-arrays thereby permitting the repositioned sense amplifiers to be shared. As a result, any two adjacent memory sub-arrays share a bank of sense amplifiers. Furthermore, selected bit lines from the two adjacent memory sub-arrays are coupled to metal lines within the repositioned sense amplifiers. In addition, equilibration circuits are similarly relocated to the area between the two adjacent memory sub-arrays thereby permitting selected bit lines and metal lines to be precharged and equalized in a shorter period of time. By reducing the precharge time, faster memory access can be achieved.
申请公布号 US6759280(B2) 申请公布日期 2004.07.06
申请号 US20020246834 申请日期 2002.09.18
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 LEE JAE JIN
分类号 G11C11/4097;H01L21/8242;H01L27/108;(IPC1-7):H01L21/82 主分类号 G11C11/4097
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