发明名称 Protective layer for corrosion prevention during lithography and etch
摘要 Forming a protective layer such as chromium, chrome alloys, nickel or cobalt as a cap over an aluminum film protects an underlying ITO layer from corrosion during the fabrication of flat panel displays such as field emission devices and the like. The presence of the protective layer during fabrication processes such as photolithography prevents diffusion of solutions through the aluminum into the ITO. This protective layer is especially effective during the development and resist stripping stages of photolithography which use solutions or solvents that would otherwise cause reductive corrosion of ITO in contact with aluminum. The methods and apparatus described herein are particularly advantageous for the fabrication of flat panel displays such as field emission devices and other display devices, because ITO is often used in such devices in contact with aluminum while exposed to corrosion-inducing media.
申请公布号 US6759181(B2) 申请公布日期 2004.07.06
申请号 US20030365925 申请日期 2003.02.13
申请人 MICRON TECHNOLOGY, INC. 发明人 HANSON ROBERT J.
分类号 G03F7/00;H01J9/02;H01J9/20;H01L31/18;(IPC1-7):G03F7/20 主分类号 G03F7/00
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