发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to restrain the formation of an interface oxide layer between a lower electrode and a dielectric film by nitrifying the surface of the lower electrode. CONSTITUTION: A capacitor insulating layer(36) is formed on a semiconductor substrate(30). A capacitor hole is formed by selectively etching the capacitor insulating layer. A lower electrode(38) is formed in the capacitor hole. The surface of the lower electrode is nitrified by using remote plasma. Then, a dielectric film and an upper electrode are sequentially formed on the lower electrode.
申请公布号 KR20040059971(A) 申请公布日期 2004.07.06
申请号 KR20020086479 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, GWANG JUN;KIM, YUN SU
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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