发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to restrain the formation of an interface oxide layer between a lower electrode and a dielectric film by nitrifying the surface of the lower electrode. CONSTITUTION: A capacitor insulating layer(36) is formed on a semiconductor substrate(30). A capacitor hole is formed by selectively etching the capacitor insulating layer. A lower electrode(38) is formed in the capacitor hole. The surface of the lower electrode is nitrified by using remote plasma. Then, a dielectric film and an upper electrode are sequentially formed on the lower electrode.
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申请公布号 |
KR20040059971(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086479 |
申请日期 |
2002.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, GWANG JUN;KIM, YUN SU |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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