发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to improve leakage current and breakdown voltage without reducing capacitance. CONSTITUTION: A lower electrode(25) made of a conductive silicon layer is formed on a semiconductor substrate(20). By sequentially and alternately oxidizing and nitrifying the conductive silicon layer, the first SiO2 layer(26), the first Si3N4 layer(27), the second SiO2 layer(28) and the second Si3N4 layer(29) are formed on the lower electrode. Then, a dielectric film and an upper electrode are sequentially formed on the resultant structure.
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申请公布号 |
KR20040059970(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086478 |
申请日期 |
2002.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;OH, HUN JEONG;PARK, JONG BEOM |
分类号 |
H01L27/108;H01L21/02;H01L21/20;H01L21/314;H01L21/321;H01L21/82;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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