发明名称 MASK OF EXPOSURE EQUIPMENT USING SCAN METHOD
摘要 PURPOSE: A mask of exposure equipment using a scan method is provided to optimize the overlay accuracy in a process for printing a thin film pattern on a substrate by controlling the deviation of the scan direction. CONSTITUTION: A mask of exposure equipment using a scan method includes a mask body, one or more pattern regions, and an alignment key. The pattern regions(234) are formed on the mask body(232). The pattern region includes a plurality of total pitch keys(237), which are formed between each edge and edges of external sides vertical to the scan direction. The alignment key(233) is formed around the pattern region.
申请公布号 KR20040060187(A) 申请公布日期 2004.07.06
申请号 KR20020086726 申请日期 2002.12.30
申请人 LG.PHILIPS LCD CO., LTD. 发明人 KIM, YONG HWAN;LEE, CHANG JUN
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址