发明名称 |
MASK OF EXPOSURE EQUIPMENT USING SCAN METHOD |
摘要 |
PURPOSE: A mask of exposure equipment using a scan method is provided to optimize the overlay accuracy in a process for printing a thin film pattern on a substrate by controlling the deviation of the scan direction. CONSTITUTION: A mask of exposure equipment using a scan method includes a mask body, one or more pattern regions, and an alignment key. The pattern regions(234) are formed on the mask body(232). The pattern region includes a plurality of total pitch keys(237), which are formed between each edge and edges of external sides vertical to the scan direction. The alignment key(233) is formed around the pattern region.
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申请公布号 |
KR20040060187(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086726 |
申请日期 |
2002.12.30 |
申请人 |
LG.PHILIPS LCD CO., LTD. |
发明人 |
KIM, YONG HWAN;LEE, CHANG JUN |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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