发明名称 |
DEVICE AND METHOD FOR OPTIMALLY DESIGNING IC HAVING SAME FUNCTION AND PERFORMANCE AS FIRST CIRCUIT, AND RECORDING MEDIUM RECORDING PROGRAM FOR THE SAME |
摘要 |
PURPOSE: A device and a method for optimally designing an IC having the same function and performance as the first circuit, and a recording medium recording a program for the same are provided to attain high optimization accuracy and reach desired analysis in a short time by combining optimization of each transistor and entire circuit. CONSTITUTION: An operating range judging tool(11) extracts a node voltage and a transistor current of the circuit, converts the extracted node voltage into an inter-node voltage of the transistor, and judges an operating range by using the inter-node voltage of the transistor and a threshold voltage of the transistor current. An operating range analyzer(12) extracts the node voltage and the transistor current of the circuit, converts the extracted node voltage into the inter-node voltage of the transistor, and displays a linear characteristic and a saturation characteristic by using the inter-node voltage of the transistor and the transistor current. A sweep sensitivity analyzer(13) displays a change of an output property for the circuit when a circuit parameter is changed by alpha percentage.
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申请公布号 |
KR20040060796(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20030097360 |
申请日期 |
2003.12.26 |
申请人 |
SEIKO INSTRUMENTS KABUSHIKI KAISHA ALSO TRADING AS SEIKO INSTRUMENTS INC.;SIPEC CORPORATION |
发明人 |
MORI KENJI;NAKAJIMA TAKASHI |
分类号 |
G06F17/50;H01L21/82;H03K19/00;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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