发明名称 |
CMP APPARATUS WITH SPRAY NOZZLE OF ULTRA PURE WATER FOR REMOVING SLURRY |
摘要 |
PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to prevent the generation of particles by removing slurry on a wafer using a spray nozzle of ultra pure water. CONSTITUTION: A CMP apparatus includes a pusher(30) for transporting a wafer to a rotary transporter(40). The CMP apparatus further includes a spray nozzle(50) of ultra pure water. By spraying the ultra pure water to the wafer using the spray nozzle, slurry on the wafer is removed. The spray nozzle of the ultra pure water is provided with a plurality of spray holes(52a).
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申请公布号 |
KR20040059861(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086366 |
申请日期 |
2002.12.30 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
KIM, DEOK JUNG |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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