发明名称 CMP APPARATUS WITH SPRAY NOZZLE OF ULTRA PURE WATER FOR REMOVING SLURRY
摘要 PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to prevent the generation of particles by removing slurry on a wafer using a spray nozzle of ultra pure water. CONSTITUTION: A CMP apparatus includes a pusher(30) for transporting a wafer to a rotary transporter(40). The CMP apparatus further includes a spray nozzle(50) of ultra pure water. By spraying the ultra pure water to the wafer using the spray nozzle, slurry on the wafer is removed. The spray nozzle of the ultra pure water is provided with a plurality of spray holes(52a).
申请公布号 KR20040059861(A) 申请公布日期 2004.07.06
申请号 KR20020086366 申请日期 2002.12.30
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 KIM, DEOK JUNG
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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