Arrangement for generating multiple clocks in field programmable gate arrays of a network test system

摘要

A test system for a design of a network device under test includes an oscillator configured for generating a first clock signal for a first clock domain, and field programmable gate arrays. Each field programmable gate array is configured for performing device operations according to the first clock domain and transferring data to another device at a network data rate based on a second clock domain. Each field programmable gate array includes clock conversion logic configured for generating a second clock signal for the second clock domain, based on the first clock signal. Hence, the generation of the second clock signal within each field programmable gate array ensures that timing accuracy is maintained, enabling communication between the field programmable gate arrays at high-speed data rates based on the second clock domain.