发明名称 |
METHOD FOR MANUFACTURING DUAL GATE OXIDE LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a dual gate oxide layer of a semiconductor device is provided to simplify manufacturing process without using an additional process. CONSTITUTION: A gate oxide layer, a conductive layer and a hard mask(6) are sequentially stacked on a substrate defined by a cell and peripheral region. A gate pattern is formed by patterning the stacked structure. By performing gate re-oxidation processing, a thick gate oxide layer(2A) is formed on the cell region and a thin gate oxide layer(2B) is formed on the peripheral region.
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申请公布号 |
KR20040059931(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086436 |
申请日期 |
2002.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, HEUNG JAE;LEE, JEONG HO;LIM, GWAN YONG |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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