发明名称 METHOD FOR MANUFACTURING DUAL GATE OXIDE LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a dual gate oxide layer of a semiconductor device is provided to simplify manufacturing process without using an additional process. CONSTITUTION: A gate oxide layer, a conductive layer and a hard mask(6) are sequentially stacked on a substrate defined by a cell and peripheral region. A gate pattern is formed by patterning the stacked structure. By performing gate re-oxidation processing, a thick gate oxide layer(2A) is formed on the cell region and a thin gate oxide layer(2B) is formed on the peripheral region.
申请公布号 KR20040059931(A) 申请公布日期 2004.07.06
申请号 KR20020086436 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, HEUNG JAE;LEE, JEONG HO;LIM, GWAN YONG
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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