发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to prevent damage of a bit line in a peripheral region by forming a support insulating layer on a hard mask of a cell region. CONSTITUTION: An interlayer dielectric(12) is formed on a substrate(10) defined by a cell region(S) and a peripheral region(P). Bit lines(14) with a hard mask are formed on the interlayer dielectric. A support insulating layer(30) is formed on the hard mask of the cell region to improve topology between the cell and peripheral region. An insulating spacer(16) is formed at both sidewalls of the support insulating layer, the hard mask and the bit line of the cell region. A storage node contact hole is formed by selectively etching the interlayer dielectric. A contact plug(20) is then formed in the contact hole.
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申请公布号 |
KR20040060218(A) |
申请公布日期 |
2004.07.06 |
申请号 |
KR20020086760 |
申请日期 |
2002.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, SEONG HWAN;YOO, JE HYEON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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